VLSI Design and Test
by S. Rajaram (Editor)N. B. Balamurugan (Editor)D. Gracia Nirmala Rani (Editor)Virendra Singh (Editor)
Format: Paperback
ISBN13: 9789811359491
Paperback|9789811359491
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Overview
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
| ISBN-13 | 9789811359491 |
|---|---|
| ISBN-10 | 9811359490 |
| Weight | 2.25 Pounds |
| Dimensions | 6.10 x 1.67 x 9.25 In |
| List Price | $109.99 |
| Edition | 1st Edition |
| Format | Paperback |
|---|---|
| Language | English |
| Pages | xviii, 722 pages |
| Publisher | Springer |
| Published On | 2019-01-25 |
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Print on demand Contains: Illustrations, black & white, Illustrations, color. Communications in Com...
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