Transmission Electron Microscopy and Diffractometry of Materials
Format: Hardcover
ISBN13: 9783540437642
Hardcover|9783540437642
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Overview
This practical and theoretical text/reference develops the concepts of transmission electron microscopy and x-ray diffractometry. This acclaimed new edition contains many improved explanations and new material on high-resolution microscopy.
| ISBN-13 | 9783540437642 |
|---|---|
| ISBN-10 | 3540437649 |
| Weight | 1.10 Pounds |
| Dimensions | 6.14 x 1.63 x 9.21 In |
| List Price | $99.00 |
| Edition | 2nd Edition |
| Format | Hardcover |
|---|---|
| Pages | xxi, 748 pages |
| Publisher | Springer |
| Published On | 2005-03-14 |
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Peak Books
Holly Springs, NC, USA
Sewn binding. Cloth over boards. 748 p. Contains: Illustrations. Advanced Texts in Physics (Hardcove...
Free delivery by: 29 Mar 2026