Test and Diagnosis for Small-Delay Defects
Format: Paperback
ISBN13: 9781489989529
Paperback|9781489989529
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Overview
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
| ISBN-13 | 9781489989529 |
|---|---|
| ISBN-10 | 1489989528 |
| Weight | 0.73 Pounds |
| Dimensions | 6.10 x 0.53 x 9.25 In |
| List Price | $129.99 |
| Edition | 1st Edition |
| Format | Paperback |
|---|---|
| Language | English |
| Pages | xviii, 212 pages |
| Publisher | Springer |
| Published On | 2014-11-28 |
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Alibris
Sparks, NV, USA
Print on demand Trade paperback (US). Glued binding. 212 p. Contains: Tables, black & white.
Free delivery by: 02 Apr 2026