9780138137595

Scanning Electron Microscopy and X-Ray Microanalysis

Format: Hardcover

ISBN13: 9780138137595

Hardcover|9780138137595


Overview

A description of the field of scanning electron microscopy and X-ray microanalysis, including coverage of specimen preparation, electron emission, lenses and electromagnetic fields, specimen-beam interactions, vacuum generation, and energy and wavelength dispersive X-ray spectroscopy.

ISBN-13

9780138137595

ISBN-10

0138137595

Weight

1.90 Pounds

Dimensions

7.25 x 1.00 x 9.75 In

List Price

$105.00

Format

Hardcover

Pages

464 pages

Publisher

Prentice Hall

Published On

1992-09-01



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