Scanning Electron Microscopy
Format: Hardcover
ISBN13: 9783540853176
Hardcover|9783540853176
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Overview
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
| ISBN-13 | 9783540853176 |
|---|---|
| ISBN-10 | 3540853170 |
| List Price | $229.00 |
| Edition | 3rd Edition |
| Format | Hardcover |
|---|---|
| Language | English |
| Pages | 511 pages |
| Publisher | Springer |
| Published On | 2020-11-15 |
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