Scanning Electron Microscopy
Format: Paperback
ISBN13: 9783642083723
Paperback|9783642083723
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Overview
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
| ISBN-13 | 9783642083723 |
|---|---|
| ISBN-10 | 3642083722 |
| Weight | 1.66 Pounds |
| Dimensions | 6.10 x 1.23 x 9.25 In |
| List Price | $299.99 |
| Edition | 2nd Edition |
| Format | Paperback |
|---|---|
| Language | English |
| Pages | xiv, 529 pages |
| Publisher | Springer |
| Published On | 2010-12-01 |
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Alibris
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Print on demand Springer Series in Optical Sciences . XIV, 529 p. Intended for professional and sch...
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