Scanning Electron Microscopy
by L. Reimer (Guest Editor)D. L. MacAdam (Editor)A. L. Schawlow (Editor)K. Shimoda (Editor)A. E. Siegman (Editor)T. Tamir (Editor)H. K. Lotasch (Editor)Peter W. Hawkes (Guest Editor)
Format: Hardcover
ISBN13: 9783540639763
Hardcover|9783540639763
✨ Featured Offer
Brand New
$301.38
List Price: $329.99
🚚
See all 3 offers from $136.23 FREE standard delivery by: 02 Apr 2026
Overview
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
| ISBN-13 | 9783540639763 |
|---|---|
| ISBN-10 | 3540639764 |
| Weight | 4.54 Pounds |
| Dimensions | 6.50 x 1.25 x 9.75 In |
| List Price | $329.99 |
| Edition | 2nd Edition |
| Format | Hardcover |
|---|---|
| Language | English |
| Pages | xiv, 529 pages |
| Publisher | Springer |
| Published On | 1998-09-17 |
View All Offers
Sort by:
Price
Condition
Seller
Seller Comments
Price
Used, Good
Seller details
Goodwill Industries
Eugene, OR, USA
Free delivery by: 02 Apr 2026
Used, Good
Seller details
Bonita
Santa Clarita, CA, USA
Access codes and supplements are not guaranteed with used items. May be an ex-library book.
Free delivery by: 02 Apr 2026
✨ Brand New
Seller details
GridFreed
San Diego, CA, USA
Size: 9x6x0; In shrink wrap. Looks like an interesting title!
Free delivery by: 02 Apr 2026