Overview

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.


ISBN-13

9780387747460

ISBN-10

038774746X

Weight

1.80 Pounds

Dimensions

6.10 x 1.10 x 9.55 In

List Price

$169.99

Edition

1st Edition

Format

Hardcover

Language

English

Pages

xii, 408 pages

Publisher

Springer

Published On

2007-12-10



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